Low voltage electron microscopy principles and applications ed. by David C. Bell and Natasha Erdman. Publ. in assoc. with the Royal Microscopical Society
Contributor(s): Bell, David C [editor of compilation.]
| Erdman, Natasha [editor of compilation.] | Royal Microscopical Society
Material type: 
TextLanguage: English Publisher: Chichester Wiley 2013Description: XIII, 203 S. Ill. (some color), graph. DarstISBN: 9781119971115 (hbk.)Subject(s): Electron microscopy -- Technique | Electron microscopes | Electron microscopy | Low-voltage scanning electron microscopyDDC classification: 502.8/25 | SCI047000 LOC classification: QH212.E4Other classification: 33.05 | 33.18 | 33.68 | UH 6300 Online resources: Cover | table of contents Summary: "The book describes the recent advances in the area of low-voltage electron microscopy, covering topics in TEM, SEM, STEM"--Summary: "Part of the Wiley-Royal Microscopical Society Series, this book discusses the rapidly developing cutting-edge field of low-voltage microscopy, a field that has only recently emerged due to the rapid developments in the electron optics design and image processing. It serves as a guide for current and new microscopists and materials scientists who are active in the field of nanotechnology, and presents applications in nanotechnology and research of surface-related phenomena, allowing researches to observe materials as never before"--
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
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Book
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Books at groups | SSU Electron Microscopy | Not for loan |
Includes bibliographical references and index
"The book describes the recent advances in the area of low-voltage electron microscopy, covering topics in TEM, SEM, STEM"--
"Part of the Wiley-Royal Microscopical Society Series, this book discusses the rapidly developing cutting-edge field of low-voltage microscopy, a field that has only recently emerged due to the rapid developments in the electron optics design and image processing. It serves as a guide for current and new microscopists and materials scientists who are active in the field of nanotechnology, and presents applications in nanotechnology and research of surface-related phenomena, allowing researches to observe materials as never before"--
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